منابع مشابه
Matching of IC Patterns under Non-Uniform Illumination
The use of hierarchical Chamfer Matching (CM) to match die patterns on VLSI wafers for the alignment of semiconductor chips is presented. This method can extract images with non-umform lighting (without loss) for matching, and somehow it is invariant to some environment changes. Here, it is applied to align IC patterns under non-uniform lighting while the normalized correlation method fails. Ex...
متن کاملAutomatic human face detection and recognition under non-uniform illumination
A system for automatic human face detection and recognition is presented. The procedure consists of "ve steps: (1) the Haar wavelet transform, (2) facial edge detection, (3) symmetry axis detection, (4) face detection and (5) face recognition. Step 1 decomposes an input image, reducing image redundancy. Step 2 excludes non-facial areas using edge information, whereas Step 3 narrows down face ar...
متن کاملModified Panel Splitting Naturalness Preservation For Non- Uniform Illumination Images
Image enhancement is an important tool for processing image. There exits many enhancement algorithms, in which Retinex algorithm enhance details of an image and is widely used. Retinex algorithm can remove illumination but cannot maintain the range of reflectance, hence it is not essential for non-uniform illumination images. So to preserve naturalness along with enhancing the details we propos...
متن کاملEfficient naturalness restoration for non-uniform illumination images
Abstract: This study presents a novel image-naturalness restoration for the purpose of achieving better image quality with respect to the human visual system. Specifically, the authors suppress the artefacts around edges using image gradient components. They also appropriately enhance the image brightness using an adaptive gamma correction. In particular, they simply create a mapping curve to a...
متن کاملNon-uniform Illumination Correction in Transmission Electron Microscopy
Transmission electron microscopy (TEM) provides resolutions on the order of a nanometer. Hence, it is a critical imaging modality for biomedical analysis at the sub-cellular level. One of the problems associated with TEM images is variations in brightness due to electron imaging defects or non-uniform support films and specimen staining. These variations render image processing operations such ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Laser and Particle Beams
سال: 1985
ISSN: 0263-0346,1469-803X
DOI: 10.1017/s0263034600001488